Researcher

 

Brandon Hernandez is a research associate at Idaho National Laboratory’s Materials and Fuels Complex. At the Irradiated Materials Characterization Laboratory, he is responsible for the day-to-day operation of the newly installed FEI Helios plasma focused ion beam (FIB) and for the development of new workflows for transmission electron microscope (TEM) sample prep and EBSD analysis using this instrument. Brandon has over 18 years of experience in the electron microscopy industry, most recently as a New Product Introduction Engineer at FEI in Hillsboro, OR. There, he was responsible for the successful release of new FIB instrumentation into the field. His previous work experience included time in field service, applications, and hands-on analysis in TEM, scanning electron microscope (SEM), and FIB dualbeam instrumentation. He has an associate degree in Natural Science & Engineering with an emphasis in Electron Microscopy from San Joaquin Delta College and a bachelor’s in Business Administration from the University of Alabama.