Researcher

John Olson

Staff Engineer/Scientist

Research Areas:
Chemical and Radiation Measurements

Biography:

John E. Olson is s staff engineer and scientist at Idaho National Laboratory, specializing in applications and fundamentals of mass spectrometry and, most recently, the development of instrumentation for performing wide isotope ratio measurements. He has been one of the primary researchers in transitioning the iodine analysis to Accelerator Mass Spectrometry for performing isotopic ratio measurements on environmental samples. His responsibilities include electronic and hardware design as well as the software development necessary for mass spectrometry instrumentation. He holds a master’s in measurement and control engineering from Idaho State University, where he also earned his bachelor’s in engineering. From 1993 to 1996 he was a post-master’s fellow, helping develop the instrumentation and software necessary for computer control of instruments involved in SIMS analysis of various surfaces.

Education:

M.S., Measurement and Control Engineering - Idaho State University

B.S., Engineering - Idaho State University

A.A.S., Electronic Systems Technology - Idaho State University

Publications:

"Electrodeposition as an alternate method for preparation of environmental samples for iodide by AMS", Adamic, M.L., Lister, T.E., Dufek, E.J., Jenson, D. D., Olson, J.E., Vockenhuber, C., Watrous, M.G., Nuclear Instruments & Methods In Physics Research Section B-Beam Interactions with Materials and Atoms, Volume: 361, Oct. 15, 2015, pp. 372-375.

"Radioactive cesium isotope ratios as a tool for determining dispersal and re-dispersal mechanisms downwind from the Nevada Nuclear Security Site", Snyder, DC, Delmore, JE, Tranter, T, Mann, NR, Abbot, ML, Olson, JE, Journal of Environmental Radioactivity, Volume: 110, Aug. 2012, pp. 46-52.

"Surface analyisis of particulates from laboratory hood exhaust manifold", Gary S. Groenewold, Marnie M. Cortez, Anita K. Gianotto, Garold Gresham, John E. Olson, Robert V. Fox, Byron M. White,William F. Baurer, Recep Avci, Muhammedin Deliorman and Eric Williams, Surface and Interface Analysis, 39(2007)547-553.

"Binding of Molecular O2 to Di- and Tri-Ligated [UO2]+", Gary S. Groenewold,* Kevin C. Cossel, Garold L. Gresham, Anita K. Gianotto, Anthony D. Appelhans, John E. Olson, Michael J. Van Stipdonk, * and Winnie Chien, Journal of the American Chemical Society, Volume: 128, Issue: 9, March 08, 2006, pp. 3075-3084.

"Wide Dispersion multiple collector isotope ratio mass spectrometer", Anthony D. Appelhans, James E. Delmore, John E. Olson, International Journal of Mass Spectrometry,241(2005) 1 - 9.

"Hydration of Alumina Cluster Anions in the Gas Phase," Gianotto, A. K.; Rawlinson, J. W.; Cossel, K. C.; Olson, J. E.; Appelhans, A. D.; Groenewold, G. S. Journal of the American Chemical Society, 2004, 126, 8275-8283.

"Ion-molecule reactions of gas-phase chromium oxyanions: CrxOyHZ-+O-2", Gianotto AK, Hodges BDM, Harrington PDB, Appelhans AD, Olson JE, Groenewold GS. Journal of the American Society For Mass Spectrometry. 14(10) (2003) 1067-1075.

"Ion-molecule reactions of gas-phase chromium oxyanions: CrxOyHz-+ H20", Gianotto AK, Hodges BDM, Benson MT, Harrington PD, Appelhans AD, Olson JE, Groenewold GS. Journal of Physical Chemistry A. 107(31) (2003) 5948-5955.

"Gas-phase hydration of U(IV), U(V), and U(VI) dioxo monocations", Gresham GL, Gianotto AK, Harrington PD, Cao LB, Scott JR, Olson JE, Appelhans AD, Van Stipdonk MJ, Groenewold GS. Journal of Physical Chemistry A. 107(41) (2003) 8530-8538.

"Static SIMS analysis of carbonate on basic alkali-bearing surfaces", Shaw A.D., Cortez M.M., Gianotto A.K., Appelhans A.D., Olson J.E., Karahan C., Avci R., Groenewold G.S. Surface and Interface Analysis. 35(2003) 310-317.

"High Temperature Langmuir Vaporization Mass Spectrometer", Delmore, J.E.; Kessinger, G. F.; Dahl, D. A.; Olson, J. E., International Journal of Mass Spectrometry. 225 (2003) 1-10.

"Hydrolysis of VX on Concrete. Rate of Degradation Using an Ion Trap Secondary Ion Mass Spectrometer", Gary S. Groenewold, John M. Williams, Anthony D. Appelhans, Garold Gresham, John E. Olson, Mark T. Jeffery and Brad Rowland. Environ. Sci. & Technology. 36(2002) 4790 – 4794.

"Electron flood charge compensation device for ion trap secondary ion mass spectrometry", AD Appelhans, MB Ward, and JE Olson, International Journal of Mass Spectrometry. 221(2002) 21 – 38.

"Identification of Nitrogen Based Blister Agents bis(2-chloroethyl)methylamine (HN-2) and tris(2-chloroethyl)amine (HN-3), and their HYDROLYSIS Products on Soil Using Ion Trap SIMS", Gresham, G. L.; Groenwold, G. S.; Olson, J. E., J. Mass Spectrometry, Vol. 35, No. 12, 2000, 1460.

"Static SIMS and MS² Characterization of Distilled Mustard on Soil Particle Surfaces", Gresham, G. L.; Groenewold, G. S.; Appelhans, A. D.; Olson, J. E.; Benson, M. T.; Jeffery, M.; Rowland, B.; Weibel, M. Int. J. Mass Spectrometry, 208(2001) 135-145.

"Detection and Characterization of Trace Contaminants on Surfaces via Ion Trap Secondary Ion Mass Spectrometry," Appelhans, A. D.; Ingram, J. C.; Groenewold, G. S.; Dahl, D. A.; Olson, J. E.; Delmore, J. E., in ECASIA 97, 7^th European Conference on Applications of Surface and Interface Analysis, Olefjord, I.; Nyborg, L.; Briggs, D., eds., John Wiley and Sons, New York, 1997. Pages 549-52.

"Analysis of VX on Soil Particles Using an Ion Trap Secondary Ion Mass Spectrometer," Groenewold, G. S.; Appelhans, A. D.; Gresham, G. L.; Olson, J. E., Jeffery, M.; Wright, J. B. Anal. Chem.,Vol. 71, No. 13(1999) 2318 - 2323.

"Characterization of VX on Concrete Using Ion Trap SIMS," Groenewold, G. S.; Appelhans, A. D.; Gresham, G. L.; Olson, J. E.; Jeffery, M.; Weibel, M. J. Am. Soc. Mass Spectrom., 2000, 11, 69 – 77.

"Identification of Mineral Phases on Basalt Surfaces by Imaging SIMS", Jani C. Ingram, Gary S. Groenwold, John E. Olson, and Anita K. Gianotto, in Analytical Chemistry, Vol. 71, No. 9(1999) 1712-1719.

"Static SIMS Investigation of Tetraethylammonium Bromide on Soil Particles using ReO4- and Ga+ Projectiles," Groenewold, G. S.; Gianotto, A. K.; Olson, J. E.; Appelhans, A. D.; Ingram, J. C.; Delmore, J. E. Int. J. Mass Spectrom. Ion Proc., 174(1998)129-142.

"A Neural Network Technique to Classify Regions of Interest in SIMS Images", Olson, J. E.; Ingram, J. C.; Groenewold, G. S.; Gianotto, A. K., in Secondary Ion Mass Spectrometry SIMS XI, Lareau, R. T., ed., John Wiley & Sons, New York, 1998,

"Characterization of Basalt Surfaces Using Imaging SIMS", Ingram, J. C.; Groenewold, G. S.; Olson, J. E.; Gianotto, A. K., in Secondary Ion Mass Spectrometry SIMS XI, Lareau, R. T., ed., John Wiley & Sons, New York, 1998.

"Disappearance Cross Sections of Ammonium Adsorbates on Environmental Surfaces", Groenewold, G. S.; Appelhans, A. D.; Gianotto, A. K.; Olson, J. E.; Ingram, J. C.; Delmore, J. E., in Secondary Ion Mass Spectrometry SIMS XI, Lareau, R. T., ed., John Wiley & Sons, New York, 1998.

"Secondary ion mass spectrometry of sodium nitrate: comparison of ReO₄^- and Cs⁺ primary ions", G.S. Groenewold, J.E. Delmore, J.E. Olson, A.D. Appelhans, J.C. Ingram, D.A. Dahl, International Journal of Mass Spectrometry and Ion Processes, 163(1997) 185-195.

"Surface Ionization Ion Sources and Applications", J.E. Delmore, A.D. Appelhans, J.E. Olson, T. Huett, G.S. Groenewold, J.C. Ingram and D.A. Dahl, Journal of the Royal Society of Western Australia, 79:103-107, 1996.

"Ion/Neutral Mass Spectrometry of Thermal Ionizers-Application to Ionization Mechanisms from Zeolites", J.E. Delmore, T. Huett, J.E. Olson and A.D. Appelhans, International Journal of Mass Spectrometry and Ion Processes, 155(1996) 149-162.

"Characterization of bis-(Phenoxy)Phosphazine Polymers using Static Secondary Ion Mass Spectrometry", G.S. Groenewold, R.L. Cowan, J.C. Ingram, A.D. Appelhans, J.E. Delmore, J.E. Olson, Surface Interface and Analysis, Vol. 24, 794-802(1996).

"Direct Surface Analysis of Pesticides on Soil, Leaves, Grass, and Stainless Steel by Static Secondary Ion Mass Spectrometry", J.C. Ingram, G.S. Groenewold, A.D. Appelhans, J.E. Delmore, J.E. Olson, D.L. Miller, Environmental Science and Technology, 31, 402-408 (1997).

"Self Imaging of Surface Ionization Ion Sources-Where do the ions come from?", J.E. Delmore, A.D. Appelhans and J.E. Olson, International Journal of Mass Spectrometry and Ion Processes, 140(1994)111-122.

Patents:

David A. Dahl, Jill R. Scott, Anthony D. Appelhans, Timothy R. McJunkin, John E. Olson, 2009, "Continuous sampling ion mobility spectrometers and methods therefor," Patent 7,518,105, April 14, 2009.

David A. Dahl, Jill R. Scott, Anthony D. Appelhans, Timothy R. McJunkin, John E. Olson, 2009, "Ion Mobility Spectrometers and Methods for Ion Mobility Spectrometry," Patent 7,518,106, April 14, 2009.

Anthony D. Appelhans, John E. Olson, James E. Delmore, 2006, "Mass Spectrometer and Methods of Increasing Dispersion Between Ion Beams," Patent 6,984,821, January 10, 2006.

David A. Dahl, Anthony D. Appelhans, John E. Olson, 1997, "Current Measuring System," Patent 5,665,966, September 9, 1997.

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